Ушбу ишга иқтибос қилган ишлар

3 та иш

Иш: Microstructural Analysis and Transport Properties of RuO₂-Based Thick Film Resistors

1. On the Conduction Mechanism of Silicate Glass Doped by Oxide Compounds of Ruthenium (Thick Film Resistors). 3. The Minimum of Temperature Dependence of Resistivity

   G. Abdurakhmanov

   МақолаElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics20145 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.405405

2. Interaction of RuO<sub>2</sub> and Lead-Silicate Glass in Thick-Film Resistors

   G. Abdurakhmanov, G. S. Vakhidova, Lutfullo X. Tursunov

   МақолаElectrical and Thermal Properties of MaterialsWorld Journal of Condensed Matter Physics20113 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.495414

3. Effect of Glass Composition on the Thermal Expansion of Relict Crystals of RuO<sub>2</sub> in Doped Lead-Silicate Glasses (Thick Film Resistors)

   G. Abdurakhmanov

   МақолаElectrical and Thermal Properties of MaterialsJournal of Modern Physics20110 иқтибос

   ABIABI:AkademIndex/openalex/2011.article.000311