Мақола

INFLUENCE OF THE INTERFACE ON THE ELECTRICAL CHARACTERISTICS OF MIS STRUCTURES

Shakhrukh Kh. DalievInstitute of Semiconductor Physics and Microelectronics of National University of UzbekistanFayzulla A. SaparovNational University of Uzbekistan Tashkent, Republic of Uzbekistan

European Science Reviewjournal2022en

ABI

Аннотация

Аннотация мавжуд эмас.

Мавзулар

Engineering Diagnostics and Reliability

Идентификаторлар

DOI: 10.29013/esr-22-1.2-31-35

Иқтибослар ва манбалар

1 та иқтибос0 та фойдаланилган манба

Кўрсаткичлар — AkademScholar