X-Ray fluorescence analysis utilizing the fundamental parameter method for the determination of the elemental composition in plant samples
Juichi OmoteDepartment of Bioengineering, Faculty of Engineering, Soka University, Tokyo 192, JapanHisayuki KohnoCenter for Applied Technology, Rigaku Industrial Co., Osaka 569, JapanK. TodaCenter for Applied Technology, Rigaku Industrial Co., Osaka 569, Japan
1995en
ABI
Аннотация
Аннотация мавжуд эмас.
Идентификаторлар
Иқтибослар ва манбалар
2 та иқтибос0 та фойдаланилган манба