Мақола

Study of ion scattering and dechanneling from surface defect structure by computer simulation

A.A. DzhurakhalovB.S. KalandarovUrgench State University, 740000 Urgench, UzbekistanMunis KurbonovUrgench State University, 740000 Urgench, UzbekistanUchkun KutlievUrgench State University, 740000 Urgench, UzbekistanH. DreysséIPCMS, 23 rue du Loess, BP 20 CR, 67037 Strasbourg, France

Computational Materials Sciencejournal2002en

ABI

Аннотация

Аннотация мавжуд эмас.

Мавзулар

Ion-surface interactions and analysis Semiconductor materials and devices Electron and X-Ray Spectroscopy Techniques

Идентификаторлар

DOI: 10.1016/s0927-0256(02)00172-6

Иқтибослар ва манбалар

2 та иқтибос 8 та фойдаланилган манба

Кўрсаткичлар — AkademScholar