Direct Measurement of the Temperature-Dependent Magnetic Penetration Depth in Y-Ba-Cu-O Crystals
L. Krusin‐ElbaumIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218R. L. GreeneIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218F. HoltzbergIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218A. P. MalozemoffIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218Y. YeshurunIBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598-0218
1989en
ABI
Аннотация
The temperature dependence of the magnetic penetration depth $\ensuremath{\lambda}$ is determined directly from low-field dc magnetization measurements on single-crystal Y-Ba-Cu-O (${T}_{c}=89.7$ K, $\ensuremath{\Delta}{T}_{c}=0.2$ K). The results are consistent with the behavior expected from a BCS ($s$ wave) superconductor.
Ҳали таржима қилинмаган
Идентификаторлар
Иқтибослар ва манбалар
2 та иқтибос0 та фойдаланилган манба