Ушбу ишга иқтибос қилган ишлар

3 та иш

Иш: Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces

1. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

   Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

   МақолаCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19801 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.603988

2. Electrical properties of fine crystalline and amorphous metal films, obtained by low temperature condensation (Review)

   Yu. F. Komnik

   МақолаCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19820 иқтибос

   ABIABI:AkademIndex/openalex/1982.article.000117

3. Effect of grain boundary scattering on the TCR of thin tin films

   C. R. Pichard, Yu. F. Komnik, Б. И. Белевцев +1

   МақолаCopper Interconnects and ReliabilityJournal of Materials Science Letters19830 иқтибос

   ABIABI:AkademIndex/openalex/1983.article.000029