Ушбу ишга иқтибос қилган ишлар

2 та иш

Иш: A comparison between linearized expressions of the temperature coefficient of resistance of polycrystalline films

1. Relationship of electrical resistance of polycrystalline tin films to structural characteristics

   Б. И. Белевцев, Yu. F. Komnik, V. E. Kopina +1

   МақолаCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19801 иқтибос

   ABIABI:AkademIndex/openalex/2026.other.603988

2. Electrical properties of fine crystalline and amorphous metal films, obtained by low temperature condensation (Review)

   Yu. F. Komnik

   МақолаCopper Interconnects and ReliabilitySoviet Journal of Low Temperature Physics19820 иқтибос

   ABIABI:AkademIndex/openalex/1982.article.000117