Fred H. Pollak

1 ta ish

City University of New York

1. Raman, transmission electron microscopy, and conductivity measurements in molecular beam deposited microcrystalline Si and Ge: A comparative study

   J. González‐Hernández, G. Hossein Azarbayejani, Raphael Tsu +1

   Maqola19853 iqtibos

   ABIABI:AkademIndex/2026.other.385490