George Brown

1 ta ish

Texas Instruments (United States)

1. Electron and hole trapping in irradiated SIMOX, ZMR and BESOI buried oxides

   Robert E. Stahlbush, G.J. Campisi, J.B. McKitterick +3

   Maqola19922 iqtibos

   ABIABI:AkademIndex/2026.other.419527