D. V. Lap

1 ta ish

Friedrich Schiller University Jena

1. Ultrafast beam-deflection method and its application for measuring the transient refractive index of materials

   Hans-Stephan Albrecht, P. Heist, J. Kleinschmidt +1

   Maqola19933 iqtibos

   ABIABI:AkademIndex/2026.other.154351