D.W. Face

1 ta ish

Wilmington University

1. Critical current density and resistivity measurements for long patterned lines in Tl2Ba2CaCu2O8 thin films

   W.L. Holstein, C. Wilker, D. B. Laubacher +5

   Maqola19932 iqtibos

   ABIABI:AkademIndex/2026.other.507359