В. В. Монахов

1 ta ish

St Petersburg University

1. Characterization of conducting molecular films on silicon: Auger electron spectroscopy, X-ray photoelectron spectroscopy, atomic force microscopy and surface photovoltage

   А. S. Komolov, Kjeld Schaumburg, Preben J. Møller +1

   Maqola19992 iqtibos

   ABIABI:AkademIndex/2026.other.443248