V. D. Skupov

1 ta ish

N. I. Lobachevsky State University of Nizhny Novgorod

1. Effect of ion irradiation on the depth profiles of microdefects in silicon

   Е. С. Демидов, N. D. Latysheva, V. A. Perevoshchikov +2

   Maqola20002 iqtibos

   ABIABI:AkademIndex/2026.other.433824