Alejandra B. Gurevich

1 ta ish

1. Infrared spectroscopic analysis of the Si/SiO2 interface structure of thermally oxidized silicon

   K. T. Queeney, M. K. Weldon, Jane P. Chang +4

   Maqola20002 iqtibos

   ABIABI:AkademIndex/2026.other.715947