U. Lindefelt

1 ta ish

ABB (Switzerland)

1. Crystal Defects as Source of Anomalous Forward Voltage Increase of 4H-SiC Diodes

   Peder Bergman, H. Lendenmann, Per Åke Nilsson +2

   Maqola20012 iqtibos

   ABIABI:AkademIndex/2026.other.659152