John C. Vickerman

1 ta ish

University of Southampton

1. A C₆₀ Primary Ion Beam System for Time of Flight Secondary Ion Mass Spectrometry:  Its Development and Secondary Ion Yield Characteristics

   Daniel E. Weibel, Steve Wong, Nicholas P. Lockyer +3

   Maqola20033 iqtibos

   ABIABI:AkademIndex/2026.other.493023