Peter Günter

1 ta ish

ETH Zurich

1. Characterization of second and third order optical nonlinearities of ZnO sputtered films

   Maria Cristina Larciprete, D. Haertle, A. Belardini +3

   Maqola20052 iqtibos

   ABIABI:AkademIndex/2026.other.549583