In-Hwan Baek

1 ta ish

Samsung (South Korea)

1. A Low‐Temperature‐Grown Oxide Diode as a New Switch Element for High‐Density, Nonvolatile Memories

   Myoung‐Jae Lee, Sunae Seo, D.‐C. Kim +11

   Maqola20062 iqtibos

   ABIABI:AkademIndex/2026.other.043058