R. Kužel

2 ta ish

Charles University

1. Preparation and basic electrical properties of CdTe thick films

   J. Toušková, J. Toušek, E. Klier +1

   Maqola19792 iqtibos

   ABIABI:AkademIndex/2026.other.299133

2. Evaluation of substructure parameters by peak profile analysis of high-resolution neutron diffraction spectra

   P. Lukáš, Pavel Strunz, Vadim Davydov +1

   MaqolaX-ray Diffraction in CrystallographyPowder Diffraction20090 iqtibos

   ABIABI:AkademIndex/2009.article.000296