John S. Suehle

1 ta ish

National Institute of Standards and Technology

1. Large random telegraph noise in sub-threshold operation of nano-scale nMOSFETs

   J. P. Campbell, Lihua Yu, Kin P. Cheung +4

   Maqola20096 iqtibos

   ABIABI:AkademIndex/2026.other.397912