X. Aymerich

1 ta ish

Autonomous University of Barcelona

1. Channel-Hot-Carrier Degradation and Bias Temperature Instabilities in CMOS Inverters

   J. Martín-Martínez, Simone Gerardin, E. Amat +5

   Maqola20093 iqtibos

   ABIABI:AkademIndex/2026.other.536308