H. Eisaki

1 ta ish

National Institute of Advanced Industrial Science and Technology

1. Intra-unit-cell electronic nematicity of the high-Tc copper-oxide pseudogap states

   Michael J. Lawler, K. Fujita, Jhinhwan Lee +8

   Maqola20102 iqtibos

   ABIABI:AkademIndex/2026.other.672315