B. Korff

1 ta ish

University of Bonn

1. Identification of defect properties by positron annihilation in Te-doped GaAs after Cu in-diffusion

   Mohamed Elsayed, R. Krause‐Rehberg, W. Anwand +2

   Maqola20113 iqtibos

   ABIABI:AkademIndex/2026.other.360583