Amel Chenouf

1 ta ish

Centre de Développement des Technologies Avancées

1. A propagation concept of negative bias temperature instability along the channel length in p-type metal oxide field effect transistor

   Boualem Djezzar, Hakim Tahi, Abdelmadjid Benabdelmoumene +1

   Maqola20132 iqtibos

   ABIABI:AkademIndex/2026.other.536297