Yin-Nien Chen

1 ta ish

National Yang Ming Chiao Tung University

1. Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits

   Ming-Long Fan, Shao‐Yu Yang, Vita Pi‐Ho Hu +3

   Maqola20144 iqtibos

   ABIABI:AkademIndex/2026.other.570277