Yuxiang Han

1 ta ish

Peking University

1. Charge trapping at the MoS2-SiO2 interface and its effects on the characteristics of MoS2 metal-oxide-semiconductor field effect transistors

   Yao Guo, Xianlong Wei, Jiapei Shu +6

   Maqola20152 iqtibos

   ABIABI:AkademIndex/2026.other.511870