Hai Jiang

1 ta ish

Purdue University West Lafayette

1. Integrated modeling of Self-heating of confined geometry (FinFET, NWFET, and NSHFET) transistors and its implications for the reliability of sub-20 nm modern integrated circuits

   Woojin Ahn, SangHoon Shin, Chang‐Ming Jiang +3

   Maqola20185 iqtibos

   ABIABI:AkademIndex/2026.other.386767