Yuning Tao

1 ta ish

South China University of Technology

1. Machine learning-based defect prediction model using multilayer perceptron algorithm for escalating the reliability of the software

   Sapna Juneja, Ali Nauman, Mudita Uppal +4

   MaqolaSoftware Engineering ResearchThe Journal of Supercomputing20237 iqtibos

   ABIABI:AkademIndex/2023.article.000278