Cyrian Leriche

1 ta ish

Advanced Research Center for Nanolithography (Netherlands)

1. The Surface-Topography Challenge: A Multi-Laboratory Benchmark Study to Advance the Characterization of Topography

   Asima Pradhan, Martin H. Müser, N. Miller +97

   MaqolaOAOchiq kirishSurface Roughness and Optical MeasurementsTribology Letters20250 iqtibos

   ABIABI:AkademIndex/2025.article.000091