Navjeet Bagga

3 ta ish

Indian Institute of Technology Bhubaneswar

1. Trap and self-heating effect based reliability analysis to reveal early aging effect in nanosheet FET

   Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar +1

   Maqola20222 iqtibos

   ABIABI:AkademIndex/2026.other.447599

2. Investigation of Analog/RF and linearity performance with self-heating effect in nanosheet FET

   Sunil Rathore, Rajeewa Kumar Jaisawal, P. N. Kondekar +1

   Maqola20232 iqtibos

   ABIABI:AkademIndex/2026.other.447601

3. Systematic performance benchmarking of nanosheet and FinFET: An intrinsic self-heating perspective

   Sunil Rathore, Rajeewa Kumar Jaisawal, Suneet Kumar Agnihotri +3

   Maqola20252 iqtibos

   ABIABI:AkademIndex/2026.other.447602