K. T. Shivaram

1 ta ish

Dr. Hari Singh Gour University

1. Defect Detection in Electronics Manufacturing via Deep Learning-Based Visual Inspection

   T. Srihari, A. Murugesan, Neeraj Kumar +3

   Maqola202511 iqtibos

   ABIABI:AkademIndex/2026.other.896022