L. Ashok Kumar

1 ta ish

Uttaranchal University

1. Modeling and Simulation of Defect-Induced Reliability Challenges in Modern Semiconductor Materials

   Jayanth Kolli, Kshitij Jain, Sudhanshu Maurya +3

   proceeding20250 iqtibos

   ABIABI:AkademIndex/2025.proceeding.000281