Ruslan Yorqulov

1 ta ish

1. Formation and Structural Characterization of Cu15Si4 Thin Films on Si(111) by RFMS and DCMS Magnetron Sputtering

   Kuvondik Dovranov, Muradulla Normuradov, Eli Danladi +7

   MaqolaOAOchiq kirish20260 iqtibos

   ABIABI:AkademIndex/2026.article.080909