I. Vassilev

1 ta ish

Institute of Physics of Bulgarian Academy of Sciences, Sofia, Bulgaria

1. Comparison of X‐ray topographical images in implanted silicon crystals at different absorption conditions

   Z. Furmanik, H. Hubrig, M. Maciaszek +1

   MaqolaCrystallography and Radiation PhenomenaKristall und Technik19790 iqtibos

   ABIABI:AkademIndex/openalex/1979.article.000080