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P. Charvát

1 ta ish

Department of Chemical Technology of Electronics Materials, Institute of Chemical Technology, 166 28, Prague, Czechoslovakia

  1. Depth profiles of Sb atoms implanted into Ti

    V. Havránek, V. Hnatowicz, J. Kvítek +3

    MaqolaIon-surface interactions and analysisRadiation effects and defects in solids19910 iqtibos
    ABI