Igor Usov

1 ta ish

Cree Research Inc., Durham, NC, 27713, USA

1. Investigation of implanted layers in silicon carbide by a modulation photoreflection method

   H. Walther, H. Karge, К. Л. Муратиков +2

   MaqolaSilicon and Solar Cell TechnologiesTechnical Physics Letters19970 iqtibos

   ABIABI:AkademIndex/openalex/1997.article.000254