B. R. Dzhumaev
1 ta ish
Institute of Semiconductor Physics (Ukraine)
<title>Depth inhomogeneity of ZnTe, CdZnTe, ZnSe epilayers grown on (001)GaAs of MBE</title>
E. F. Venger, Yu. G. Sadof’ev, Galina N. Semenova +7
MaqolaAdvanced Semiconductor Detectors and MaterialsProceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE19990 iqtibosABI