Danilo Crippa

1 ta ish

1. Ultra Low Noise Epitaxial 4H-SiC X-Ray Detectors

   G. Bertuccio, S. Caccia, F. Nava +7

   MaqolaSilicon Carbide Semiconductor TechnologiesMaterials science forum20090 iqtibos

   ABIABI:AkademIndex/openalex/2009.article.000101