Ushbu ish iqtibos qilgan ishlar

10 ta ish

Ish: Backscattering measurements of postimplantation damage profiles in silicon single crystals

1. Channeling and related effects in the motion of charged particles through crystals

   D. S. Gemmell

   Maqola197410 iqtibos

   ABIABI:AkademIndex/2026.other.605082

2. A model for the formation of amorphous Si by ion bombardment

   F. F. Morehead, B. L. Crowder

   Maqola19703 iqtibos

   ABIABI:AkademIndex/2026.other.578785

3. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659393

4. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659394

5. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659395

6. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659396

7. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659397

8. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659398

9. Sarlavhasiz

   Boshqa1 iqtibos

   ABIABI:AkademIndex/2026.other.659399

10. Sarlavhasiz

    Boshqa1 iqtibos

    ABIABI:AkademIndex/2026.other.659400