Maqola

Comparison of X‐ray topographical images in implanted silicon crystals at different absorption conditions

Z. FurmanikInstitute of Physics of Polish Academy of Sciences, Al. Lotnikow 32/46, Warszawa, PolandH. HubrigInstitute of Nuclear Physics of Academy of Sciences of GDR, Rossendorf, GDRM. MaciaszekInstitute of Physics of Bulgarian Academy of Sciences, Sofia, BulgariaI. VassilevInstitute of Physics of Bulgarian Academy of Sciences, Sofia, Bulgaria

Kristall und Technikjournal1979en

Ochiq kirish: yoʻq

ABI

Annotatsiya

Annotatsiya mavjud emas.

Mavzular

Crystallography and Radiation Phenomena Particle Detector Development and Performance X-ray Spectroscopy and Fluorescence Analysis

Identifikatorlar

DOI: 10.1002/crat.19790140312

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