A secondary ion mass spectrometry study of two-layer systems based on tellurium
В. А. ЛабуновRadiotechnical Institute, Minsk, U.S.S.RB. KolosnicinRadiotechnical Institute, Minsk, U.S.S.RD. MartonTechnical University, Budapest, HungaryZ. MiminoshviliInstitute of Technical Electronics, Moscow, U.S.S.R
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