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Characteristic features of electron–phonon scattering in thin films of semimetals

А. В. БутенкоPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR , Khar’kovE. I. BukhshtabPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR , Khar’kovYu. F. KomnikPhysicotechnical Institute of Low Temperatures, Academy of Sciences of the Ukrainian SSR , Khar’kov

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The temperature dependence of the phase interruption time of the electron wave function τϕ, determined from measurements of the localized correction to the conductivity, in semimetal films is studied. The quantity τϕ is determined by the electron-electron (τϕ−1~T) and electron-photon (τϕ−1~T2) inelastic scattering processes. The dependence τϕ(T) has a singularity at some temperature T0, below which the quadratic contribution is “frozen out.” The temperature T0 corresponds to the condition that the wavelength of the thermal phonon equals the thickness of the film.

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