New approach to optical analysis of absorbing thin solid films
F. Demichelisthe authors are with the Physics DepartmentG. KaniadakisAll authors are with Turin Polytechnic, Turin,
Italy; the authors are with the Physics DepartmentAlberto Tagliaferrothe authors are with the Physics DepartmentE. Tressothe authors are with the Physics Department
1987en
Ochiq kirish: yoʻq
ABI
Annotatsiya
A powerful new technique is reported which enables realistic calculation of the optical energy gap of absorbing thin solid films by an analysis of measured transmittance and reflectance spectra in the fundamental absorption region. At the same time a new analytical method allows the thickness of films to be evaluated by measurements of transmittance only.
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