Asosiy kontentga oʻtish
Maqola

A CAD model for microstrips on r‐cut sapphire substrates

I. B. VendikElectrotechnical University, St. Petersburg 197376, RussiaO. G. VendikOrest G. Vendik was born in Leningrad in 1932. He received his Radio Engineer Diploma, candidat of science PhD and doctorate of science in engineering degrees in 1954, 1957, and 1966, respectively, all from Leningrad Electrical Engineering Institute (now St. Petersburg Electrotechnical University, Eltech). He jointed Eltech as a professor of applied physics. He is the head of the Eltech Cryoelectronics Group. His general research interests have been in foundation of solid state electronics (ferrite, ferroelectrics, superconductors) and microwave physics. He is concentrated on properties and applications of high-T, superconductors (HTSC) at microwaves. He has developed a localized boson phenomenological model of HTSC, which is successfully used as a basis of an orjgjnal CAD of HTSC MMICs. He takes part in elaboration of microwave components based on S-N (superconductingnormal) transitionSpartak GevorgianChalmers University of Technology, Góteborg, S-41296, SwedenM. F. SitnikovaMargarita F. Sitnikova. The biography and photograph were not available at the time of publicationEva OlssonChalmers University of Technology, Göteborg, S-41296, Sweden

Ochiq kirish: yoʻq

ABI

Annotatsiya

Abstract Simple and correct formulas are derived for calculation of an effective isotropic dielectric constant, which characterizes the wave propagation in microstrip lines on anisotropic substrates made of r‐cut sapphire crystals. The r‐plane is extensively used for epitaxial growth of high‐ T c superconductor YBa 2 Cu 3 O 7 films as applied to microwave integrated circuits. In contradistinction to previous models developed for z‐cut sapphire, the nondiagonal dielectric permittivity tensor of r‐cut sapphire is used. The effective dielectric constant of a microstrip line on r‐cut sapphire substrate is found as a function of the strip‐line geometry and the orientation of the crystallographic axes with respect to the symmetry plane of the microstrip line. © 1994 John Wiley & Sons, Inc.

Hali tarjima qilinmagan

Mavzular

Identifikatorlar

Iqtiboslar va manbalar