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23 ta ish

Ish: New Tight-Binding Method for Simulation of Defect Configurations, Creation and Diffusion Mechanisms in Solids: Application to Silicon

  1. Simplified LCAO Method for the Periodic Potential Problem

    J. C. Slater, G. F. Koster

    Maqola19546 iqtibos
    ABI
  2. (110) surface atomic structures of covalent and ionic semiconductors

    D. J. Chadi

    Maqola19795 iqtibos
    ABI
  3. Negative-U Properties for Point Defects in Silicon

    G. D. Watkins, John R. Troxell

    Maqola19805 iqtibos
    ABI
  4. Transferable tight-binding models for silicon

    I. Kwon, R. Biswas, C. Z. Wang +2

    Maqola19944 iqtibos
    ABI
  5. Computer Modelling of Electronic and Atomic Processes in Solids

    Kitob19972 iqtibos
    ABI
  6. DEFECTS IN AMORPHOUS Si:H — THE REHYBRIDIZED TWO-SITE (RTS) MODEL

    David Redfield

    Maqola19912 iqtibos
    ABI