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Ish: Characteristics of the formation of radiation defects in silicon structures

1. Radiation effects in semiconductor devices

   Ф. П. Коршунов, G. V. Gatalskii, G.M. Ivanov

   Maqola19786 iqtibos

   ABIABI:AkademIndex/2026.other.235262

2. Sarlavhasiz

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   ABIABI:AkademIndex/2026.other.624548