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X-RAY MEASUREMENT OF ICF TARGET USING SURFACE PROFILER SCANNING

Yuan Liuqiong, LUO Qing, WANG Ming da Institute of Nuclear Physics and Chemistry, CAEP, P

High Power Laser and Particle Beamsjournal2000en

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ABI

Annotatsiya

The X ray radiography technique for measurement of ICF targets. Record film images of microspheres using contact microradiography. Analysis the X ray images using surface profiler, direct measuring the wall thickness of single wall microsphere. Comparsed this measurement with the optical interferometric measurement and found measurement differences 0.3μm.

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Mavzular

Optical measurement and interference techniques Medical Imaging Techniques and Applications Optical Systems and Laser Technology

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