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Generation of X-ray beams by photons and relativistic electrons on crystals under the Bragg condition

Y.N. AdischevNucl. Phys. Inst., Tomsk Polytech. Univ., RussiaS.I. ArischevTomsk polytechnic UniversityИ. Е. ВнуковNuclear Physics Institute, Tomsk Polytechnic University, TomskA. V. VukolovМеждународная научно-образовательная лаборатория «Рентгеновская оптика»V. N. ZabaevTomsk polytechnic UniversityB. N. KalininTomsk polytechnic UniversityV. V. KaplinNuclear Physics Institute, Tomsk Polytechnic University, TomskYu.P. KunashenkoКафедра теоретической и экспериментальной физикиН. Н. НасоновBelgorod State University, Belgorod, RussiaA.P. PotylytsynNuclear Physics Institute, Tomsk Polytechnic University, TomskS. R. UglovNuclear Physics Institute, Tomsk Polytechnic University, TomskУ. С. СалихбаевNuclear Physics Laboratory, Samarkand State University, UzbekistanA. N. SafarovNuclear Physics Laboratory, Samarkand State University, UzbekistanV. I. SkripnikSamarkand State UniversityI. KhakberdievNuclear Physics Laboratory, Samarkand State University, UzbekistanAlisher YusupovNuclear Physics Laboratory, Samarkand State University, Uzbekistan

2002en

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ABI

Annotatsiya

The parametric x-ray (PXR) photon yield from single-crystal tungsten was studied in the Bragg geometry in an experiment on the SIRIUS synchrotron in Tomsk using an e-beam with the energy E=500 MeV. The tungsten crystal thickness was 1.7 mm and the surface mosaicity - not more than 1.5'. The crystal was aligned as [111] with the Bragg angle /spl theta//sub B/=45/spl deg/ to the e-beam direction. The photons were detected at 2/spl theta//sub B/=90/spl deg/ with respect to the e-beam. The angular PXR distributions were compared with the calculations including the real experimental conditions. The experimental setup for measurement diffraction of bremstrahlung of electrons in the silicon crystal is described. The arrangement is based on the microtrone MT-22, with electron beam energy 13 MeV and 22 MeV.

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Mavzular

Crystallography and Radiation Phenomena Advanced X-ray Imaging Techniques X-ray Spectroscopy and Fluorescence Analysis

Identifikatorlar

DOI: 10.1109/korus.2001.975125

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