Asosiy kontentga oʻtish
Maqola

Single-shot<i>Y</i>-scan for characterization of the nonlinear optical parameters of transparent materials

R. A. GaneevThe Institute for Solid State Physics, The University of Tokyo, 5-1-5 Kashiwanoha,#N#Kashiwa, Chiba 277-8581,#N#JapanI. A. KulaginInstitute of Electronics, Uzbekistan Academy of Sciences, Akademgorodok, Tashkent#N#100125,#N#Uzbekistan

Ochiq kirish: yoʻq

ABI

Annotatsiya

We demonstrate a new single-shot technique for measuring the nonlinear optical characteristics of various transparent materials. The method allows analysis of nonlinear refraction and nonlinear absorption using tilted samples placed at the focal plane of a cylindrical lens. This technique was used in the cases of carbon disulfide and platinum nanoparticle suspension to define their nonlinear optical parameters. We compare this method with the standard Z-scan technique.

Hali tarjima qilinmagan

Mavzular

Identifikatorlar

Iqtiboslar va manbalar