Method for determining the depleted zone thickness in silicon charged particle detectors
S. V. ArtemovAcademy of Sciences of UzbekistanG. A. RadyukInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Tashkent, 702132, UzbekistanА. А. КараходжаевInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Tashkent, 702132, UzbekistanYa. S. AbdullaevaAcademy of Sciences of UzbekistanV. P. YakushevInstitute of Nuclear Physics, Academy of Sciences of Uzbekistan, Tashkent, 702132, Uzbekistan
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A method for determining the thickness of silicon charge particle detectors has been developed. The method is based on measurements of spectra from a standard 137Cs γ source, whose shape changes with detector thickness. The method can be used in the thickness range ∼50–6000 μm with an accuracy from 20 to 10%, respectively. No complex equipment or laborious calculations are needed.
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